发明名称 LOGIC DEVICE AND METHOD SUPPORTING SCAN TEST
摘要 A logic device includes a data input, a scan test input, a clock demultiplexer, and a master latch. The clock demultiplexer is responsive to a clock input to selectively provide a first clock output and a second clock output. The master latch is coupled to the data input and to the scan test input and includes an output. The master latch is responsive to the first clock output of the clock demultiplexer and the second clock output of the clock demultiplexer to selectively couple the data input or the scan test input to the output.
申请公布号 KR101139149(B1) 申请公布日期 2012.04.26
申请号 KR20097001335 申请日期 2007.06.18
申请人 发明人
分类号 G01R31/3185;G01R31/3177 主分类号 G01R31/3185
代理机构 代理人
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