SEMICONDUCTOR MEMORY MICROCIRCUIT WITH BUILT-IN SELF-TESTING AND REPAIR MEANS

摘要

A semiconductor memory microcircuit with built-in self-testing and repair means relates to computer equipment and can be used to build storing devices providing self-restoring under failures detected with built-in self-testing means. Switching on a redundant array of memory cells provides forming an additional data position and allows recording or reading off from it data that were intended for storage in one data position failed.