发明名称 Test access port with address and command capability
摘要 The disclosure provides a novel method and apparatus for inputting addresses to devices to select the device TAP for access. Further, the disclosure provides a novel method and apparatus for inputting addresses for selecting device TAPs and for inputting commands for commanding circuitry within the device. The inputting of addresses or the inputting of addresses and commands is initiated by a control bit input on TDI that is recognized during the Run Test/Idle, Pause-DR or Pause-IR TAP states.
申请公布号 US8166358(B2) 申请公布日期 2012.04.24
申请号 US20100970097 申请日期 2010.12.16
申请人 WHETSEL LEE D.;TEXAS INSTRUMENTS INCORPORATED 发明人 WHETSEL LEE D.
分类号 G01R31/28 主分类号 G01R31/28
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