Method and system for interrogating the thickness of a carbon layer

摘要

A method and system for interrogating a thickness of a carbon layer are described. The carbon layer resides on at least one of a magnetic recording head and a magnetic recording disk. The method and system include providing an enhancement film on the carbon layer. The enhancement film is continuous across a portion of the carbon layer. The method and system also include exposing the enhancement film to light from a light source and detecting scattered light from the carbon layer to provide a surface enhanced Raman spectroscopy (SERS) spectrum. The enhancement film resides between the light source and the carbon layer. The method and system also include determining the thickness of the carbon layer based on the SERS spectrum.