发明名称 Reactive sputtering method and device
摘要 The present invention provides a method for reactive sputtering in which a reactive sputtering apparatus including a sputtering vaporization source 2 provided with a metal target disposed in a vacuum chamber 1, a sputtering power source 4 to drive the sputtering vaporization source 2, and an introduction mechanism 5 to introduce an inert gas for sputtering and a reaction gas for forming a compound with sputtered metal into the vacuum chamber 1 is used, and reactive sputtering film formation is performed on a substrate 3 disposed in the above-described vacuum chamber, wherein the method includes the steps of performing constant-voltage control to control the voltage of the above-described sputtering power source 4 at a target voltage Vs and, in addition, performing target voltage control at a control speed lower than the speed of the above-described constant-voltage control, the target voltage control operating the above-described target voltage Vs in order that the spectrum of plasma emission generated forward of the above-described sputtering vaporization source 2 becomes a target value.
申请公布号 US8163140(B2) 申请公布日期 2012.04.24
申请号 US20040515730 申请日期 2004.11.26
申请人 IKARI YOSHIMITSU;TAMAGAKI HIROSHI;KOHARA TOSHIMITSU;KOBE STEEL, LTD. 发明人 IKARI YOSHIMITSU;TAMAGAKI HIROSHI;KOHARA TOSHIMITSU
分类号 C23C14/34;C23C14/00;C23C14/08;C23C14/32;C23C14/54;F02B67/06;F16H7/08;H01J37/32;H01J37/34 主分类号 C23C14/34
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