发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent a crystal structure from being damaged due to an ion implantation process by removing the ion implantation process. CONSTITUTION: A substrate(110) includes a first surface(111a) and a second surface(111b,111c) which is recessed on both sides of the first surface. A gate pattern(120) includes a gate electrode(122) and a gate insulation layer(121) formed on the first surface. A gate spacer(124) is formed on a sidewall of the gate pattern and protects the side of a gate electrode. A silicon buffer layer(131) is formed on the second surface. A source region(132) and a drain region(133) are located on the silicon buffer layer.</p>
申请公布号 KR20120038195(A) 申请公布日期 2012.04.23
申请号 KR20100099825 申请日期 2010.10.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, KEUM SEOK;LEE, SEUNG HUN;LEE, BYEONG CHAN;KANG, SANG BOM;PARK, HONG BUM
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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