发明名称 APPARATUS FOR INSPECTING SUBSTRATE
摘要 PURPOSE: A substrate inspecting apparatus is provided to improve yield by preventing a defective substrate. CONSTITUTION: A stage(120) is installed on the upper side of a support frame(110). The stage receives or floats a substrate. A substrate transfer module(130) moves the substrate along the upper side of the stage. A top inspecting module(140) includes a first reflection inspection camera(141), a transmission inspection camera(142), and a top review camera(143). A bottom inspecting module(150) includes a bottom review camera(152) which precisely inspects the bottom of the substrate with a second reflection inspection camera(151).
申请公布号 KR20120037771(A) 申请公布日期 2012.04.20
申请号 KR20100099428 申请日期 2010.10.12
申请人 LIGADP CO., LTD. 发明人 PARK, SU CHUL
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
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