发明名称 SIDE CHANNEL ATTACK RESISTANCE EVALUATING DEVICE, AND SIDE CHANNEL ATTACK RESISTANCE EVALUATING METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To improve resistance evaluation accuracy by separating a signal source related to confidential information from the other signal sources which become noise. <P>SOLUTION: A side channel information measuring portion 2 measures side channel information which leaks from an encryption device 1 of an evaluation target. A passing band deciding portion 4 decides a passing band of a quefrency window. A cepstrum analyzing portion 3 executes cepstrum analysis on tha basis of the passing band of the quefrency window, to the side channel information measured by the side channel information measuring portion 2. A DSCA resistance evaluating portion 5 determines the pros and cons of resistance to a side channel attack of the encryption device 1 of the evaluation target, on the basis of the side channel information analyzed by the cepstrum analyzing portion 3. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012080344(A) 申请公布日期 2012.04.19
申请号 JP20100223993 申请日期 2010.10.01
申请人 NEC CORP 发明人 YAMASHITA TETSUTAKA
分类号 H04L9/10 主分类号 H04L9/10
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