发明名称 METHODS OF FORMING GATE DIELECTRIC MATERIAL
摘要 A method of forming gate dielectric material includes forming a silicon oxide gate layer over a substrate. The silicon oxide gate layer is treated with a first ozone-containing gas. After treating the silicon oxide gate layer, a high dielectric constant (high-k) gate dielectric layer is formed over the treated silicon oxide gate layer.
申请公布号 US2012094504(A1) 申请公布日期 2012.04.19
申请号 US201113004309 申请日期 2011.01.11
申请人 YAO LIANG-GI;CHEN CHIA-CHENG;WANN CLEMENT HSINGJEN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YAO LIANG-GI;CHEN CHIA-CHENG;WANN CLEMENT HSINGJEN
分类号 H01L21/283 主分类号 H01L21/283
代理机构 代理人
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