发明名称 CMOS IMAGE SENSOR AND FABRICATING METHOD THEREOF
摘要 A method includes: forming a transfer gate on a semiconductor substrate; forming a first ion implantation region on a first side of the transfer gate; forming a second ion implantation region on the first side of the transfer gate such that the second ion implantation region encloses the first ion implantation region; forming a third ion implantation region along a surface of the semiconductor substrate; and forming a floating diffusion region at a second side of the transfer gate.
申请公布号 US2012094419(A1) 申请公布日期 2012.04.19
申请号 US201113240400 申请日期 2011.09.22
申请人 LIM YOUN-SUB;INTELLECTUAL VENTURES II LLC 发明人 LIM YOUN-SUB
分类号 H01L27/146;H01L31/18;H01L21/425;H01L21/8238;H01L31/10;H04N5/335;H04N5/369;H04N5/374 主分类号 H01L27/146
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