发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of improving reverse breakdown voltage. <P>SOLUTION: A semiconductor device comprises: a semiconductor layer 100 of one conductive type; an insulating layer 130; semiconductor layers 210 provided in the insulating layer; active elements 20 provided in the semiconductor layers 210; a semiconductor region 112 of the other conductive type provided on a primary surface 201 on the semiconductor layer 100; a semiconductor region 114 of the other conductive type that is provided in the semiconductor region 112 and has a high impurity concentration than the semiconductor region 112; a conductor 154 provided in a through hole 144 in the insulating layer 130 so as to connect the semiconductor region 114; conductors 214, which are provided on or in the insulating layer 130, that is provided around the conductor 154 and in which outside end portions are located at a more outer side than the semiconductor region 114; a conductor 192 provided in connection with the conductor 154 and the conductors 214; and conductors 152 and 120 provided in connection with the semiconductor layer 100. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012080045(A) |
申请公布日期 |
2012.04.19 |
申请号 |
JP20100226717 |
申请日期 |
2010.10.06 |
申请人 |
LAPIS SEMICONDUCTOR CO LTD;HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION;INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH |
发明人 |
KASAI HIROKI;ARAI YASUO;HATSUI TAKAKI |
分类号 |
H01L27/14;H01L27/146;H01L29/41;H01L29/786;H01L29/861;H01L31/09 |
主分类号 |
H01L27/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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