发明名称 SPECIMEN INSPECTION AUTOMATION DEVICE AND SYSTEM, AND AUTOMATIC ANALYZING DEVICE AND SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a specimen inspection automation system which performs notification by which a device status and the summary of a call to an operator is recognizable, thereby reducing a waste of work time of the operator. <P>SOLUTION: A specimen inspection automation system includes notification means, such as a pilot lamp and a speaker, which is recognizable by an operator who is in a state of being distant from a device. The specimen inspection automation system has a notification section for calling the operator and a notification section for notifying of a device status, and the combination of notifications by these notification sections allows simple and easy recognition of the device status and the summary of work of the operator. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012078264(A) 申请公布日期 2012.04.19
申请号 JP20100225311 申请日期 2010.10.05
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YAMAGUCHI SHIGEKI;OGA HIROSHI;TAKAHASHI KENICHI;FUKUGAKI TATSUYA;ONUMA MITSURU
分类号 G01N35/00 主分类号 G01N35/00
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