发明名称 ABNORMALITY HISTORY RETENTION DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an abnormality history retention device for a secondary battery, capable of surely recording and retaining abnormality history of overdischarge, etc. in a secondary battery with a simple structure. <P>SOLUTION: An abnormality history retention device 1 includes: an abnormal detection circuit 2 that detects an abnormality of a secondary battery E0 based on output of the secondary battery E0 and outputs the detection result; a switching element S1 that conducts based on the detection result; a heating element 3 that is heated after a discharge current I1 passes from the secondary battery E0 when the switching element S1 conducts; and a thermal fuse 4 that is blown by the heat from the heating element 3. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012079513(A) 申请公布日期 2012.04.19
申请号 JP20100222706 申请日期 2010.09.30
申请人 GS YUASA CORP 发明人 SHIRAISHI TAKAYUKI
分类号 H01M10/48;G01R19/165;G01R31/36;H01M2/10;H02J7/00 主分类号 H01M10/48
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