发明名称 STRAINED STRUCTURE OF A P-TYPE FIELD EFFECT TRANSISTOR
摘要 In a p-type field effect transistor, a pair of spacers are formed over the top surface of a substrate. A channel recess cavity includes an indentation in the substrate top surface between the pair of spacers. A gate stack has a bottom portion in the channel recess cavity and a top portion extending outside the channel recess cavity. A source/drain (S/D) recess cavity has a bottom surface and sidewalls below the substrate top surface. The S/D recess cavity has a portion extending below the gate stack. A strained material is filled the S/D recess cavity
申请公布号 US2012091540(A1) 申请公布日期 2012.04.19
申请号 US20110984703 申请日期 2011.01.05
申请人 CHENG CHUN-FAI;FUNG KA-HING;HUANG LI-PING;LU WEI-YUAN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHENG CHUN-FAI;FUNG KA-HING;HUANG LI-PING;LU WEI-YUAN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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