发明名称 COMPOSITION FOR REMOVING A NEGATIVE PHOTORESIST RESIDUE AND CLEANING METHOD USING THE SAME
摘要 PURPOSE: A composition for eliminating negative photoresist residues and a cleaning method using the same are provided to prevent the generation of pollutants such as metallic impurities by omitting the use of metal ion containing components. CONSTITUTION: A composition for eliminating negative photoresist residues includes 2-40 weight% of alkylbenzene sulfonic acid, 50-97 weight% of alkylbenzene compound, and 1-10 weight% of dihydroxy benzene compound. The alkylbenzene sulfonic acid is one or more selected from a group including dodecyl benzenesulfonic acid, toluene sulfonic acid, o-cresol sulfonic acid(2-methylphenol sulfonic acid), cresol sulfonic acid(methylphenol sulfonic acid), cumenesulfonic acid, xylene sulfonic acid, 2,5-xylene sulfonic acid, 2,4-xylene sulfonic acid, camphorsulfonic acid, and the salts of the same. The alkylbenzene compound is one or more selected from o-dimethyl benzene, m-dimethyl benzene, p-dimethyl benzene, 1,2,3-trimethyl benzene, and 1,3,5-trimethyl benzene. The dihydroxy benzene compound is one or more selected from catechol, resorcinol, and hydroquioline.
申请公布号 KR20120036604(A) 申请公布日期 2012.04.18
申请号 KR20100098367 申请日期 2010.10.08
申请人 DONGWOO FINE-CHEM CO., LTD. 发明人 MYUNG, JUNG JAE;HONG, HUN PYO
分类号 G03F7/42;H01L21/306 主分类号 G03F7/42
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