发明名称 Determination of electromagnetic properties of samples
摘要 Described herein is a measurement device (200) for measuring the electromagnetic properties of millimetre or sub-millimetre sized samples. The measurement device (200) is substantially two-dimensional and comprises a measurement chamber (210) in which two reflective surfaces (220, 225) are arranged. Each reflective surface (220, 225) forms part of an ellipse (230, 235) having a first focal point (240, 245) and a second focal point (250, 255). The second focal point (250, 255) of each ellipse is arranged to be coincident and a sample holder is positioned at the coincidental focal points (250, 255). An input/output port (260, 265) is provided at the first focal point (240, 245) of each ellipse (230, 235). Electromagnetic energy is directed from at least one of the input/output ports (260, 265) towards the reflective surfaces (220, 225) and onto the sample holder containing a sample at the coincidental focal points (250, 255). Reflected and/or transmitted electromagnetic energy from the sample is directed back towards at least one of the input/output ports (260, 265) and transmitted for processing. An antenna (270, 275) is associated with each input/output port (260, 265) to assist in the direction of the electromagnetic energy into and out of the measurement chamber (210).
申请公布号 EP2442096(A1) 申请公布日期 2012.04.18
申请号 EP20110184867 申请日期 2011.10.12
申请人 IMEC;KATHOLIEKE UNIVERSITEIT LEUVEN, K.U. LEUVEN R&D 发明人 ENAYATI, AMIN;BREBELS, STEVEN;DE RAEDT, WALTER;VANDENBOSCH, GUY
分类号 G01N22/00;G01N21/35 主分类号 G01N22/00
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