摘要 |
Described herein is a measurement device (200) for measuring the electromagnetic properties of millimetre or sub-millimetre sized samples. The measurement device (200) is substantially two-dimensional and comprises a measurement chamber (210) in which two reflective surfaces (220, 225) are arranged. Each reflective surface (220, 225) forms part of an ellipse (230, 235) having a first focal point (240, 245) and a second focal point (250, 255). The second focal point (250, 255) of each ellipse is arranged to be coincident and a sample holder is positioned at the coincidental focal points (250, 255). An input/output port (260, 265) is provided at the first focal point (240, 245) of each ellipse (230, 235). Electromagnetic energy is directed from at least one of the input/output ports (260, 265) towards the reflective surfaces (220, 225) and onto the sample holder containing a sample at the coincidental focal points (250, 255). Reflected and/or transmitted electromagnetic energy from the sample is directed back towards at least one of the input/output ports (260, 265) and transmitted for processing. An antenna (270, 275) is associated with each input/output port (260, 265) to assist in the direction of the electromagnetic energy into and out of the measurement chamber (210). |
申请人 |
IMEC;KATHOLIEKE UNIVERSITEIT LEUVEN, K.U. LEUVEN R&D |
发明人 |
ENAYATI, AMIN;BREBELS, STEVEN;DE RAEDT, WALTER;VANDENBOSCH, GUY |