| 摘要 |
PURPOSE: A multichip package is provided to constantly control data access time of a first semiconductor chip and a second semiconductor chip by first to N-th control signals. CONSTITUTION: A first semiconductor chip(1) generates a control signal according to a test signal or fuse cutting state in response to a test mode enable signal. A first semiconductor chip delays a first internal data by corresponding to a first delay section set by a control signal. A second semiconductor chip delays a second internal data by corresponding to a second delay section set by the control signal. A first control signal generating unit(11) generates a control signal according to a test signal if the test mode enable signal is enabled and generates the control signal according to a fuse cutting state if a test mode enable signal is disabled. |
