发明名称 Gate electrode in a trench for power MOS transistors
摘要 A trench-typed power MOS transistor comprises a trench-typed gate area, which includes a gate conductor and an isolation layer. A thin sidewall region of the isolation layer is formed between the gate conductor and a well region. A thick sidewall region of the isolation layer is formed between the gate conductor and a double diffusion region. A thick bottom region of the isolation layer is formed between the gate conductor and a deep well region.
申请公布号 US8159025(B2) 申请公布日期 2012.04.17
申请号 US20100683014 申请日期 2010.01.06
申请人 TANG MING;CHIAO SHIH-PING;PTEK TECHNOLOGY CO., LTD. 发明人 TANG MING;CHIAO SHIH-PING
分类号 H01L29/66;H01L21/336 主分类号 H01L29/66
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