发明名称 Superjunction device having a dielectric termination and methods for manufacturing the device
摘要 A superjunction semiconductor device is provided having at least one column of a first conductivity type and at least one column of a second conductivity type extending from a first main surface of a semiconductor substrate toward a second main surface of the semiconductor substrate opposed to the first main surface. The at least one column of the second conductivity type has a first sidewall surface proximate the at least one column of the first conductivity type and a second sidewall surface opposed to the first sidewall surface. A termination structure is proximate the second sidewall surface of the at least one column of the second conductivity type. The termination structure includes a layer of dielectric of an effective thickness and consumes about 0% of the surface area of the first main surface. Methods for manufacturing superjunction semiconductor devices and for preventing surface breakdown are also provided.
申请公布号 US8159039(B2) 申请公布日期 2012.04.17
申请号 US20090352276 申请日期 2009.01.12
申请人 CHENG XU;ICEMOS TECHNOLOGY LTD. 发明人 CHENG XU
分类号 H01L29/06;H01L21/30;H01L21/762 主分类号 H01L29/06
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