发明名称 Formation of TSV backside interconnects by modifying carrier wafers
摘要 An integrated circuit structure includes a semiconductor wafer, which includes a first notch extending from an edge of the semiconductor wafer into the semiconductor wafer. A carrier wafer is mounted onto the semiconductor wafer. The carrier wafer has a second notch overlapping at least a portion of the first notch. A side of the carrier wafer facing the semiconductor wafer forms a sharp angle with an edge of the carrier wafer. The carrier wafer has a resistivity lower than about 1×108 Ohm-cm.
申请公布号 US8158489(B2) 申请公布日期 2012.04.17
申请号 US20100751512 申请日期 2010.03.31
申请人 HUANG HON-LIN;HSIAO CHING-WEN;HSU KUO-CHING;CHEN CHEN-SHIEN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG HON-LIN;HSIAO CHING-WEN;HSU KUO-CHING;CHEN CHEN-SHIEN
分类号 H01L21/30 主分类号 H01L21/30
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