发明名称 |
SEMICONDUCTOR DEVICES INCLUDING SOURCE/DRAIN REGIONS WITH ABRUPT JUNCTION PROFILES AND METHODS OF FABRICATING THE SAME |
摘要 |
<p>PURPOSE: A semiconductor device which includes source/drain regions with a steep slope junction profile and a manufacturing method thereof are provided to perform a heat treatment process for diffusing impurities at low temperatures, thereby providing excellent junction leakage current properties. CONSTITUTION: A semiconductor substrate(1) is etched using a gate pattern as an etching mask. A pair of active trenches(19a,19b) is formed on the semiconductor substrate by being separated from each other. Epitaxial layers(21,25) are respectively formed within the activity trenches. The epitaxial layer is formed by successively laminating a first layer and a second layer. The first and second layers are formed into a semiconductor layer which has a lattice constant larger than the semiconductor substrate.</p> |
申请公布号 |
KR20120035699(A) |
申请公布日期 |
2012.04.16 |
申请号 |
KR20100097386 |
申请日期 |
2010.10.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LI MING;SIM, SANG PIL;SEO, KANG ILL;OH, CHANG WOO;BAE, DONG IL |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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