发明名称 |
NANOIMPRINT MOLD, MANUFACTURING METHOD THEREOF, AND NANOIMPRINT METHOD USING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To eliminate thickness unevenness of a resist film after imprint even in a nanoimprint method using a fine uneven pattern. <P>SOLUTION: The nanoimprint mold 10 is manufactured by forming the fine uneven pattern on the surface of a substrate. The substrate 12 which has a surface shape of the surface existing after mold release treatment is applied and before the uneven pattern is formed, and having 1 to 3 nm of a three-σ value regarding distribution in level difference is used as the substrate to manufacture the nanoimprint mold. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012074556(A) |
申请公布日期 |
2012.04.12 |
申请号 |
JP20100218527 |
申请日期 |
2010.09.29 |
申请人 |
FUJIFILM CORP |
发明人 |
SATO HISATOSHI |
分类号 |
H01L21/027;B29C33/38;B29C59/02 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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