发明名称 MEMORY DEVICE INCLUDING VARIABLE RESISTANCE ELEMENTS
摘要 A memory device including variable resistance elements comprises a plurality of memory cells configured to store data; a first signal transmission/reception unit and a second signal transmission/reception unit configured to transmit a signal to the memory cells or receive a signal from the memory cells; a first transmission line arranged to couple first ends of the memory cells to the first signal transmission/reception unit; and a second transmission line configured to couple second ends of the memory cells to the second signal transmission/reception unit, wherein a first resistance of a first signal path coupled between the first and second signal transmission/reception units through a first memory cell of the memory cells is substantially equal to a second electrical resistance of a second signal path coupled between a second memory cell and the first and second signal transmission/reception units through a second memory cell of the memory cells.
申请公布号 US2012087168(A1) 申请公布日期 2012.04.12
申请号 US20100899985 申请日期 2010.10.07
申请人 HWANG SANG MIN 发明人 HWANG SANG MIN
分类号 G11C5/06;G11C11/02;G11C11/21;G11C11/22;G11C11/34 主分类号 G11C5/06
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