| 摘要 |
A method and system for identifying power defects using test pattern switching activity is disclosed. In one embodiment, a plurality of test patterns is applied to a circuit under test, and failure test patterns are identified from the plurality of test patterns by comparing the test result with the predicted test result. A switching activity count is obtained for each of the plurality of test patterns. Based on the switching activity count, ranks for each of the plurality of test patterns are provided. A correlation analysis is performed between the failure test patterns and the ranks of the switching activities. When there is a high correlation between the failure test pattern and the ranks of the switching activities, it is determined that the circuit likely contains a power defect. A power defect analysis is performed under the presence of the high correlation. |
