发明名称 BORON ION IMPLANTATION USING ALTERNATIVE FLUORINATED BORON PRECURSORS, AND FORMATION OF LARGE BORON HYDRIDES FOR IMPLANTATION
摘要 Methods of implanting boron-containing ions using fluorinated boron-containing dopant species that are more readily cleaved than boron trifluoride. A method of manufacturing a semiconductor device including implanting boron-containing ions using fluorinated boron-containing dopant species that are more readily cleaved than boron trifluoride. Also disclosed are a system for supplying a boron hydride precursor, and methods of forming a boron hydride precursor and methods for supplying a boron hydride precursor. In one implementation of the invention, the boron hydride precursors are generated for cluster boron implantation, for manufacturing semiconductor products such as integrated circuitry.
申请公布号 KR20120034798(A) 申请公布日期 2012.04.12
申请号 KR20127004010 申请日期 2006.08.30
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 OLANDER KARL M.;ARNO JOSE I.;KAIM ROBERT
分类号 H01L21/265 主分类号 H01L21/265
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