| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a film thickness measurement device for measuring a thickness of a coating film by minimum destruction of the coating film. <P>SOLUTION: The film thickness measurement device includes at least two measuring blades 31 and 31 with needle shaped tip ends; a laser displacement gauge 40 that radiates laser light to a measurement object and detects reflection light from the measurement object; and a controller 50 that measures a thickness of a coating film with the laser displacement gauge 40. The controller 50 uses the laser displacement gauge 40 in a state where the measuring blade 31 is made enter into the coating film to radiate the laser light onto the surface of the coating film and detect the reflection light from the surface of the coating film so as to measure the thickness of the coating film. <P>COPYRIGHT: (C)2012,JPO&INPIT |
