发明名称 FIELD EFFECT TRANSISTOR, AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a structure that can reduce the zero current of a field effect transistor using conductor-semiconductor junction. <P>SOLUTION: A floating electrode 102 including a conductor or a semiconductor covered with an insulator 104 is formed between a semiconductor layer 101 and a gate 105 so as to cross the semiconductor layer 101. By charging the floating electrode 102, the carrier inflow from a source electrode 103a and a drain electrode 103b is prevented. Thus, the carrier concentration of the semiconductor layer 101 can be suppressed to be sufficiently low to reduce the zero current. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012074692(A) 申请公布日期 2012.04.12
申请号 JP20110192413 申请日期 2011.09.05
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 TAKEMURA YASUHIKO
分类号 H01L21/336;H01L21/8242;H01L21/8247;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/336
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