SIMULTANEOUSLY MEASUREMENT DEVICE FOR BEAM PROFILE, POSITION AND EMITTANCE

摘要

PURPOSE: A device for measuring a shape, a location, and an emittance of a beam is provided to reduce a session for measuring physical properties of a beam because a shape, a location, and an emittance of the beam are measured at the same time without interference in a progression of the beam. CONSTITUTION: A device(10) for measuring a shape, a location, and an emittance of a beam comprises a frame(20), a first wire(35), and second wire(45). The frame comprises a through hole(25). A beam passes through the through hole. The first wire is arranged to cross the through hole to a horizontal direction. The second wire is installed to be moved to the horizontal direction with respect to the frame.