发明名称 Methods of Forming Patterns in Semiconductor Constructions, Methods of Forming Container Capacitors, and Methods of Forming Reticles Configured for Imprint Lithography
摘要 The invention includes methods of forming reticles configured for imprint lithography, methods of forming capacitor container openings, and methods in which capacitor container openings are incorporated into DRAM arrays. An exemplary method of forming a reticle includes formation of a radiation-imageable layer over a material. A lattice pattern is then formed within the radiation-imageable layer, with the lattice pattern defining a plurality of islands of the radiation-imageable layer. The lattice-patterned radiation-imageable layer is utilized as a mask while subjecting the material under the lattice-patterned layer to an etch which transfers the lattice pattern into the material. The etch forms a plurality of pillars which extend only partially into the material, with the pillars being spaced from one another by gaps. The gaps are subsequently narrowed with a second material which only partially fills the gaps.
申请公布号 US2012088348(A1) 申请公布日期 2012.04.12
申请号 US201113330973 申请日期 2011.12.20
申请人 SANDHU GURTEJ S.;MICRON TECHNOLOGY INC. 发明人 SANDHU GURTEJ S.
分类号 H01L21/02 主分类号 H01L21/02
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