发明名称 APPARATUS AND METHOD FOR TEMPERATURE CONTROL DURING POLISHING
摘要 Embodiments of the present invention relate to apparatus and method for improve uniformity of a polishing process. Embodiments of the present invention provide a heating mechanism configured to apply thermal energy to a perimeter of a substrate during polishing, or a cooling mechanism configured to cool a central region of the substrate during polishing, or a biased heating mechanism configured to create a temperature step differential on a given radius of a polishing pad.
申请公布号 WO2012021215(A3) 申请公布日期 2012.04.12
申请号 WO2011US40630 申请日期 2011.06.16
申请人 APPLIED MATERIALS, INC.;CHEN, HUNG CHIH;HSU, SAMUEL CHU-CHIANG;DANDAVATE, GAUTAM SHASHANK;KOOSAU, DENIS M. 发明人 CHEN, HUNG CHIH;HSU, SAMUEL CHU-CHIANG;DANDAVATE, GAUTAM SHASHANK;KOOSAU, DENIS M.
分类号 H01L21/304 主分类号 H01L21/304
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