发明名称 POWER CYCLE TEST APPARATUS AND METHOD FOR TESTING POWER CYCLE OF COMPUTING DEVICE
摘要 A method controls a computing device to perform a power cycle test by switching a power supply on or off using a power cycle test apparatus. The apparatus includes a timer, a counter, a power rectifier, and a display unit. The timer sets a test period of the power cycle test, controls the power rectifier to switch the power supply on, counts a test time of the power cycle test at the begin time of the test period, and controls the power rectifier to switch the power supply off when the test period elapses. The power rectifier transforms AC supplied by the power supply into DC when the power supply is switched on, provides the AC to the computing device to perform a power-on test process, and controls the computing device to perform a power-off test process when the power supply is switched off.
申请公布号 US2012089368(A1) 申请公布日期 2012.04.12
申请号 US201113034621 申请日期 2011.02.24
申请人 WANG HAI-LI;CHEN XIAN-KUI;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD 发明人 WANG HAI-LI;CHEN XIAN-KUI
分类号 G06F19/00 主分类号 G06F19/00
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