发明名称 SURFACE TREATMENT COMPOSITION, SURFACE TREATMENT METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 A surface treatment composition of this invention is a composition for treating a metal wiring-including surface of a semiconductor substrate, which includes a compound (A) represented by a specific structural formula and a solvent (B) having a boiling point at one atmospheric pressure of 50 to 300°C, and has a pH of 4 to 11. According to the surface treatment composition of the present invention, oxidation of metal wiring of a semiconductor substrate can be suppressed and deterioration of the flatness of the metal wiring portion due to unusual oxidation can be suppressed. Furthermore, when an insulating film or a barrier metal film is present on a metal wiring-including surface of the semiconductor substrate, fang and surface roughness of the metal wiring occurring in the interface between the metal wiring and the insulating film or the barrier metal film can be suppressed.
申请公布号 EP2439767(A1) 申请公布日期 2012.04.11
申请号 EP20100783375 申请日期 2010.06.01
申请人 JSR CORPORATION 发明人 MORI, YASUMASA;SHIDA, HIROTAKA;KAWAGUCHI, KAZUO;YANO, HIROYUKI;MATSUO, MIE
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
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