发明名称 INTERPOSER, PROBE CARD AND METHOD FOR MANUFACTURING INTERPOSER
摘要 <p>Disclosed is an interposer comprising a silicon substrate (20). A plurality of conductive holes (27) penetrating the silicon substrate (20) are formed by dry etching, and at least one end of each conductive hole (27) is provided with a probe (12) via a pad (45). Since conductive holes are formed in a substrate that can be processed by dry etching, a plurality of microscopic conductive holes can be continuously formed and a probe can be connected to each conductive hole. Consequently, there can be obtained an interposer wherein probes are arranged at high density.</p>
申请公布号 EP1847834(B1) 申请公布日期 2012.04.11
申请号 EP20060713381 申请日期 2006.02.09
申请人 TOKYO ELECTRON LIMITED 发明人 YAKABE, MASAMI;HOSHINO, TOMOHISA
分类号 G01R1/06;G01R1/073;H01L21/66 主分类号 G01R1/06
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