发明名称 |
INTERPOSER, PROBE CARD AND METHOD FOR MANUFACTURING INTERPOSER |
摘要 |
<p>Disclosed is an interposer comprising a silicon substrate (20). A plurality of conductive holes (27) penetrating the silicon substrate (20) are formed by dry etching, and at least one end of each conductive hole (27) is provided with a probe (12) via a pad (45). Since conductive holes are formed in a substrate that can be processed by dry etching, a plurality of microscopic conductive holes can be continuously formed and a probe can be connected to each conductive hole. Consequently, there can be obtained an interposer wherein probes are arranged at high density.</p> |
申请公布号 |
EP1847834(B1) |
申请公布日期 |
2012.04.11 |
申请号 |
EP20060713381 |
申请日期 |
2006.02.09 |
申请人 |
TOKYO ELECTRON LIMITED |
发明人 |
YAKABE, MASAMI;HOSHINO, TOMOHISA |
分类号 |
G01R1/06;G01R1/073;H01L21/66 |
主分类号 |
G01R1/06 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|