Method and device for characterizing the linear properties of an electrical component

摘要

A method and device for determining the linear response of an electrical multi-port component has an “estimation procedure” in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a “measurement procedure” in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.