发明名称 |
Test apparatus, transmission system, program, and recording medium |
摘要 |
Provided is a semiconductor test apparatus that tests a device under test, comprising a test unit that tests a device under test; and a serial transmitting section that transmits transmission data back and forth between the test unit and a control section controlling the test unit. The serial transmitting section includes a data sending section that sends a plurality of pieces of the transmission data in a predetermined order; a resending control section that resends the transmission data; and an expected acknowledgement ID storage section that stores an expected acknowledgement ID indicating identification data that is expected to be attached to an acknowledgement signal received on a transmission side. The resending control section judges whether resending is necessary based on (i) whether resend count information indicates that a piece of transmission data is resent data and (ii) the expected acknowledgment ID in the expected acknowledgement ID storage section. |
申请公布号 |
US8155897(B2) |
申请公布日期 |
2012.04.10 |
申请号 |
US20080335550 |
申请日期 |
2008.12.16 |
申请人 |
KOSUGI MASAAKI;TAMURA KAZUMOTO;ADVANTEST CORPORATION |
发明人 |
KOSUGI MASAAKI;TAMURA KAZUMOTO |
分类号 |
G06F13/00;G06F11/26 |
主分类号 |
G06F13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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