发明名称 |
Contour measuring device for measuring aspects of objects |
摘要 |
A contour measuring device includes a guide rail, a slidable assembly, and a measuring probe. The slidable assembly is slidably engaged with the guide rail. The slidable assembly includes a weight adjusting unit connected to the slidable assembly. At least part of the weight adjusting unit is detachable from the slidable assembly. The measuring probe is fixed on the slidable assembly. A weight of the slidable assembly provides a measuring force and a weight of the weight adjusting unit is adjustable to adjust a value of the measuring force. |
申请公布号 |
US8151480(B2) |
申请公布日期 |
2012.04.10 |
申请号 |
US20090646850 |
申请日期 |
2009.12.23 |
申请人 |
XIA FA-PING;HUANG WEI;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
XIA FA-PING;HUANG WEI |
分类号 |
G01B5/20 |
主分类号 |
G01B5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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