| 摘要 |
A method to facilitate positioning of diffraction spots in a diffraction pattern. This method comprises the following successive steps: a) obtaining a diffraction pattern by illuminating at least part of a sample comprising at least one periodic zone by an incident radiation beam that can be diffracted by said at least one periodic zone of the sample, and by placing a detector on the path of the beam thus diffracted; b) positioning of diffraction spots present on the diffraction pattern obtained in step a), by determining the spatial coordinates of these spots on the detector. Step b) is facilitated by the use of means in step a) to modify the shape and increase the contour length of diffraction spots forming on said pattern.
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