发明名称 |
ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, AS WELL AS RESIST FILM AND PATTERN FORMING METHOD USING COMPOSITION |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition that is excellent in resolution such as a critical dimension with no bridge defects, and DOF, as well as a resist film and a pattern forming method using the composition. <P>SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition contains a resin that is decomposed by an action of an acid to produce an amide group or a thioamide group. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012068543(A) |
申请公布日期 |
2012.04.05 |
申请号 |
JP20100214563 |
申请日期 |
2010.09.24 |
申请人 |
FUJIFILM CORP |
发明人 |
SAITO SHOICHI;KATAOKA SHOHEI;IWATO KAORU;FUJII KANA |
分类号 |
G03F7/038;C08F8/00;G03F7/38;G03F7/40;H01L21/027 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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