发明名称 PROTECTION CIRCUIT OF SEMICONDUCTOR APPARATUS
摘要 An internal circuit protection circuit includes a voltage comparison unit and an internal circuit protection unit. The voltage comparison unit is configured to compare an external driving voltage applied from outside with a reference clamp voltage and output a comparison signal. The internal circuit protection unit is configured to adjust a level of the external driving voltage to a lower level than that of the reference clamp voltage, in response to the comparison signal.
申请公布号 US2012081823(A1) 申请公布日期 2012.04.05
申请号 US201113217348 申请日期 2011.08.25
申请人 CHU SHIN HO;HYNIX SEMICONDUCTOR INC. 发明人 CHU SHIN HO
分类号 H02H9/04 主分类号 H02H9/04
代理机构 代理人
主权项
地址