发明名称 |
TESTING METHOD FOR SEMICONDUCTOR INTEGRATED ELECTRONIC DEVICES AND CORRESPONDING TEST ARCHITECTURE |
摘要 |
A testing method is described of at least one device provided with an integrated testing circuit and in communication with at least one tester where messages/instructions/test signals/information are exclusively sent from the tester to the device . A testing architecture is also described for implementing this testing method.
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申请公布号 |
US2012081137(A1) |
申请公布日期 |
2012.04.05 |
申请号 |
US201113252895 |
申请日期 |
2011.10.04 |
申请人 |
PAGANI ALBERTO;BARD JEAN-MICHEL;STMICROELECTRONICS S.R.L.;STMICROELECTRONICS (GRENOBLE 2) SAS |
发明人 |
PAGANI ALBERTO;BARD JEAN-MICHEL |
分类号 |
G01R31/00 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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