发明名称 HIGH FREQUENCY MEASUREMENT APPARATUS AND CALIBRATION METHOD FOR HIGH FREQUENCY MEASUREMENT APPARATUS
摘要 A method for calibrating voltage and current detected by a high frequency measurement apparatus is provided. By the method, a basic calibration parameter for a wide impedance range but with low accuracy and quadrant-specific calibration parameters for highly accurate calibration are calculated. This calculation is performed based, on values obtained by measuring three reference loads and true values of the reference loads. A first calibration unit of the apparatus calibrates the detected voltage and current by using the basic calibration parameter. A quadrant determining unit of the apparatus determines in which quadrant an impedance calculated from the calibrated voltage and current lies. A second calibration unit of the apparatus further calibrates the voltage and current by using a quadrant-specific calibration parameter corresponding to the determination result input from the quadrant determining unit.
申请公布号 US2012084037(A1) 申请公布日期 2012.04.05
申请号 US201113240671 申请日期 2011.09.22
申请人 DAIHEN CORPORATION 发明人 TANAKA RYOHEI
分类号 G01R35/00;G06F19/00 主分类号 G01R35/00
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