A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmed to provide test patterns and an interface to at least one device under test (DUT). The system also includes a connection to the at least one DUT, wherein the connection is coupled directly between the configurable IC and the at least one DUT.
申请公布号
WO2011150409(A3)
申请公布日期
2012.04.05
申请号
WO2011US38461
申请日期
2011.05.27
申请人
VERIGY (SINGAPORE) PTE. LTD;FILLER, W SCOTT VILLAREAL;TANTAWY, AHMED S.;VOLKERINK, ERIK H.
发明人
FILLER, W SCOTT VILLAREAL;TANTAWY, AHMED S.;VOLKERINK, ERIK H.