发明名称 Automation system for testing and measurement of system and device parameters, and control and automation of systems
摘要 A system and apparatus which allows for superior testing and measurement, as well as control and automation capabilities. This invention comprises a modular foundational system for automation that provides essential building blocks for a variety of test, measurement and internal/external control demands. The essentials include IEEE-488 communications capability which matches the caliber of large test stand, thus providing a configurable system that possesses great capabilities in test, measurement and automation, without prohibitive cost and complexities for the user. The platform described herein is also well suited for portable applications as the system does not occupy a significant amount of space.
申请公布号 US2012084604(A1) 申请公布日期 2012.04.05
申请号 US20100924616 申请日期 2010.10.01
申请人 TAMILIO FRANK 发明人 TAMILIO FRANK
分类号 G06F1/26;G06F11/263;G06F13/14 主分类号 G06F1/26
代理机构 代理人
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