发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which minimizes warpage of a sealing body where a semiconductor chip is covered with a mold resin. <P>SOLUTION: The manufacturing method of a semiconductor device includes a step for forming a first release layer 24 and a second release layer 25 in this order on the surface of a support 23, a step for forming a wiring layer 12 including a wiring pattern 17 on the surface of the second release layer 25, a step for stacking a plurality of semiconductor chips 11A-11D on the surface of a the wiring layer 12, a step for coating the surface of the wiring layer 12 including the plurality of semiconductor chips 11A-11D with a mold resin 22, a step for semi-curing the mold resin 22, a step for separating a sealing body 29 comprising the wiring layer 12, the plurality of semiconductor chips 11A-11D, and the mold resin 22 from the support 23 in this state, and a step for curing the mold resin 22 completely after the step for separating the sealing body 29 and the support 23. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012069556(A) 申请公布日期 2012.04.05
申请号 JP20100210571 申请日期 2010.09.21
申请人 TOSHIBA CORP 发明人 KAMOTO TAKU;MIURA MASAYUKI;HONMA SOICHI;TAKANO YUSUKE
分类号 H01L23/12;H01L21/56 主分类号 H01L23/12
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