发明名称 PATTERN FORMATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern formation method capable of accurately forming a fine pattern on a member to be processed. <P>SOLUTION: The pattern formation method by one embodiment includes: a process of forming a hard mask 3 having a first through groove on a first film on a member 1 to be processed; a process of forming photoresist 5 on the first film and the hard mask 3; a process of forming an altered part in the photoresist 5 by making the photoresist 5 and the first film react with each other; a process of removing the part other than the altered part of the photoresist 5 by development processing; a process of forming a second through groove in the hard mask after the development processing; and a process of etching the member to be processed using the hard mask 3 having the first and second through grooves as a mask. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012069756(A) 申请公布日期 2012.04.05
申请号 JP20100213584 申请日期 2010.09.24
申请人 TOSHIBA CORP 发明人 TANAKA TOSHIYUKI;ISHITANI MORIHARU
分类号 H01L21/027;G03F7/38 主分类号 H01L21/027
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