发明名称 |
Semiconductor structure e.g. PNP-semiconductor structure, manufacturing method, involves accelerating ions by acceleration voltage, where ions acceleration and plasma generation are independently controlled from each other |
摘要 |
<p>The method involves arranging a surface oxide layer of an emitter layer on an NPN structure, where the emitter layer manufactures a PNP structure and is provided with a vertical upper surface. A removal of the surface oxide layer is enabled by ion etching process, and plasma is generated for providing ions in a vacuum chamber by high frequency coupling, where the ions are accelerated by acceleration voltage between the plasma and a wafer. The ions acceleration and plasma generation are independently controlled from each other, and etch gases are provided from trifluoro-methane.</p> |
申请公布号 |
DE102011012087(B3) |
申请公布日期 |
2012.04.05 |
申请号 |
DE20111012087 |
申请日期 |
2011.02.23 |
申请人 |
TEXAS INSTRUMENTS DEUTSCHLAND GMBH |
发明人 |
SCHARNAGL, THOMAS;STAUFER, BERTHOLD |
分类号 |
H01L21/8228;H01L21/331 |
主分类号 |
H01L21/8228 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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