发明名称 QUARTZ GLASS HAVING ABILITY TO INHIBIT DIFFUSION OF METAL IMPURITY
摘要 <P>PROBLEM TO BE SOLVED: To provide a quartz glass having ability to inhibit diffusion of metal impurities and showing a high viscosity at high temperature, since natural silica fused quartz glass generally used so far for a semiconductor heat treatment tool does not have ability to inhibit diffusion of metal impurities, particularly copper. <P>SOLUTION: High purity synthetic silica powder is crystallized in a natural inert atmosphere and melted in an electric furnace or plasma-melted to achieve an oxygen deficiency defect ODCII content of &le;10&times;10<SP POS="POST">15</SP>/cm<SP POS="POST">3</SP>, an Si lone electron pair content of &le;2&times;10<SP POS="POST">15</SP>/cm<SP POS="POST">3</SP>and a contained Na concentration of &le;0.03 wt. ppm, whereby the objective quartz glass having ability to inhibit diffusion of metal impurities and showing a high viscosity coefficient in semiconductor heat treatment is obtained. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012066947(A) 申请公布日期 2012.04.05
申请号 JP20100210782 申请日期 2010.09.21
申请人 TOSOH CORP 发明人 YAMADA SHUSUKE;HARADA YOSHINORI;ARAI KAZUYOSHI
分类号 C03C3/06;C03B20/00 主分类号 C03C3/06
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