发明名称 MOS DEVICE WITH VARYING CONTACT TRENCH LENGTHS
摘要 A semiconductor device is formed on a semiconductor substrate. The device comprises a drain; an epitaxial layer overlaying the drain; a body disposed in the epitaxial layer, having a body top surface and a body bottom surface; a source embedded in the body, extending from the body top surface into the body; a first gate trench extending into the epitaxial layer; a first gate disposed in the first gate trench; an active region contact trench extending through the source and at least part of the body into the drain; an active region contact electrode disposed within the active region contact trench; a second gate trench extending into the epitaxial layer; a second gate disposed in the gate trench; a gate contact trench formed within the second gate; and a gate contact electrode disposed within the gate contact trench.
申请公布号 US2012080751(A1) 申请公布日期 2012.04.05
申请号 US201113316365 申请日期 2011.12.09
申请人 BHALLA ANUP;WANG XIAOBIN;PAN JI;WEI SUNG-PO;ALPHA & OMEGA SEMICONDUCTOR LIMITED 发明人 BHALLA ANUP;WANG XIAOBIN;PAN JI;WEI SUNG-PO
分类号 H01L27/092 主分类号 H01L27/092
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