发明名称 NOVEL DUAL-TONE RESIST FORMULATIONS AND METHODS
摘要 Dual tone photoresist formulations comprising a photoacid generator are described and employed in fabrication techniques, including methods of making structures on substrates, and more particularly, methods of making electronic devices (e.g. transistors and the like) on flexible substrates wherein two patterns are formed simultaneously in one layer of photoresist.
申请公布号 WO2011133680(A3) 申请公布日期 2012.04.05
申请号 WO2011US33266 申请日期 2011.04.20
申请人 BOARD OF REGENTS THE UNIVERSITY OF TEXAS SYSTEM;WILLSON, C., GRANT;JEN, WEI-LUN, KANE;RAWLINGS, BRANDON, MARK;STRAHAN, JEFFREY, RYAN 发明人 WILLSON, C., GRANT;JEN, WEI-LUN, KANE;RAWLINGS, BRANDON, MARK;STRAHAN, JEFFREY, RYAN
分类号 G03F7/00;H01L21/027 主分类号 G03F7/00
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