SIMULTANEOUS MEASUREMENT METHOD FOR INFRARED PROPERTIES OF MATERIALS

摘要

PURPOSE: A method for simultaneously measuring the infrared properties of samples is provided to enable the measurement of infrared properties of translucent or transparent samples using a contact heating method. CONSTITUTION: A method for simultaneously measuring the infrared properties of samples comprises the following steps. The sensitivity of a device is calculated by measuring the radiance of a black body(S31). The first emissivity of a first substrate and the second emissivity of a second substrate are calculated(S32). The first substrate having the first emissivity is positioned between a heater and a sample to calculate the first radiance of the sample(S33). The second substrate having the second emissivity is positioned between the heater and the object sample to calculate the second radiance of the sample at the prescribed temperature(S34).